Open Access
Table 1
Mapping between the econometric and the RDPP-SF approach.
Econometric model | RDPP-SF method |
---|---|
Set of DMUs | Design plan (DoE) |
DMU(i) | Run, i, in the DoE |
Panel/cross data | Replicated/non-replicated dataset |
vi: random variation | Statistical random variation |
ui: technical inefficiency | Non-random variation (measurement of robustness in the process) |
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